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by NANOSENSORS
 
 
 
 
 
 
2D100 

The standard (2D100) is used for a very precise x-y-calibration of the scanning mechanism. The standard consists of a 2-dimensional lattice of inverted square pyramids with 100nm pitch etched into a silicon chip.

A calibration certificate of PTB (Physikalisch Technische Bundesanstalt) is only available on special request. Nanosensors™ will mediate a contract between the customer and PTB. Please ask for details.

Lateral-(xy)-Calibration Standard (2D100)

Features:
- 100 nm pitch
- high accuracy

Detailed Specifications:

Chip  
Chip size: 5x7 mm2
Active area: 100x100 µm2

The active area is located in the center of the chip and is surrounded by the FindMe structure. The lattice of inverted pyramids make up the active area.

Lattice  
Pitch: 100 nm
Accuracy of pyramid position: 10 nm
Accuracy of pitch
(10x10 µm2 scan):
0.1%
Accuracy of pitch
(100x100 µm2 scan):
±0.01%
Pyramids  
Edge length of square pyramids: approx. 50 nm
Sidewall angle
(versus wafer surface):
54.7º
Accuracy of sidewall angle: 0.5
Depth of pyramids: approx. 35 nm

Order codes and shipping units:

Order Code Quantity Data Sheet Calibration Certificate
2D100 1 enclosed n/a
2D100-CERT 1 enclosed of PTB included

Price:

Order Code 2D100 Price 1270.00 GBP / 1380.00 EUR